Glossary
A
Agglomerate | Cohesive particles. |
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Aperture size | Distance between two adjacent warp and weft wires, measured in the projected plane at the mid-positions (w). |
ASTM E11 | = American Society for Testing and Materials; HAVER Test Sieves are also fabricated according to this standard (see International Test Sieve Comparison Table). |
Analysis instrument | HAVER CPA systems provide particle analyses with standardised units and customised inline and online solutions for the largest abstract measuring range from 10 micron up to 400 mm. |
B
BS 410 | = British Standards; HAVER Test Sieves are also fabricated according to this standard (see International Test Sieve Comparison Table). |
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C
Calibration | See "Certification". For calibration thrice as many meshes are measured as for certification. |
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Certification |
Inspection of test sieves; the sieve medium is measured in warp and weft direction with a calibrated measuring system at the customer's premises or in the laboratory of HAVER & BOECKER. The result is an inspection certificate 3.1 according to DIN EN 10 204. Learn more. en/service/product-services/inspection-documents-according-to-en-10204/ |
Charge | Test sample placed on a test sieve. |
Coning and Quartering | Common manual method of sample preparation: 1. Pile the sample in a cone. 2. Spread the pile our in a circle with a uniform thickness. 3. Divide the circle into equal quarters. 4. Discard two opposite quarters and shovel them into a conival pile for a second division. („Test Sieving Handbook No. 53, 2003 Edition“ by W.S.TYLER) |
CPA | = Computerized Particle Analysis: Technology of HAVER & BOECKER for photo-optical particle size and shape analysis of bulk materials. |
D
DIN ISO | HAVER Test Sieves are also fabricated according to this standard; DIN ISO 3310-1: sieve medium = woven wire clothDIN ISO 3310-2: sieve medium = perforated plate(see International Test Sieve Comparison Table) |
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Dry sieving: | Sieving of bulk material without using of water. |
Dynamic image analysis: | Particle size and particle shape with dynamic image analysis |
E
Electroformed sheet: | Electrochemically produced nickel foils have round or square holes in the micron range from 5 µm to 100 µm. |
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Excentric division: | The particles are accelerated outwards by means of a rotating cone in the rotating samle reducer and fall into the guide channels randomly. |
F
Feret diameter (minimum): | Smallest photo-optically detected particle dimension between two parallel tangents of the particle contour. When compared to sieve analysis results, it is a good approximation of the aperture size that the particle just passes through. |
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Feret diameter (maximum): | Largest photo-optically detected particle dimension. It is found by considering all possible connections between the pixel points of the projection surface and is not dependent on angle. |
G
Gold Test Sieves | HAVER Test Sieves / Quality "Gold" with tolerances 50% smaller than the tolerances as specified by ISO 3310-1. |
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H
HAVER REAL TIME: | During the photo-optical particle analysis (HAVER CPA) the shadow projections of the particles are evaluated simultaneously to the measuring process in real time. |
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I
Image analysis | see "Dynamic image analysis" |
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International Test Sieve Comparison Table | Listing of all standards for the fabrication of test sieves with the corresponding aperture sizes / openings. |
J
K
L
Light source | LED light module in the HAVER CPA; the shadows of the free-falling particles are formed in the background of this light. |
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Line scan camera | Digital camera with one pixel line. The operating mode is comparable with a scanner. |
M
N
Nominal size | Aperture size (woven wire cloth), size of hole (perforated plate) |
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O
P
Particle list | Option in the Software HAVER CpaServ EXPERT. The table lists each single particle along with a scaled figure and diverse measurement and analysis values. Using the function of the particle list, a supplemental manual evaluation can follow. Also filter values or user-defined classifications of the shape class, for example, can be established as well. |
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Particle size analysis | With HAVER CPA different size parameters are analysed: Feret diameter, Equivalent diameter, Length, Width (maximum), Martin diameter, Chord (maximum) Sieve analysis: smallest aperture size in a sieve medium the particle passes through. |
Particle size distribution | Result of particle analysis: frequency distribution of particle sizes, displayed in bar or line diagram (distribution curve). |
Perforated plate | Sieve medium; plate made from galvanized steel or stainless steel with regularly arranged round or square holes. |
Photo-optical particle analysis | Computerized analysis of bulk materials concerning particle size and particle shape (dynamic image analysis, CPA). |
Q
R
S
Sample | Representative part from a quantity of material or a product stream. |
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Sieve analysis | Separation and analysis of particle sizes of a sample of bulk material by means of one test sieve or a test sieve shaker and several test sieves. |
Sieve medium | Woven wire cloth or perforated plates in test sieves with identical, regularly arranged apertures. |
Sieve pan | Collecting pan for the finest material of a sample at the bottom head of a sieve tower; available in all sieve diameters. |
Sieve set | Tower made from two or more assembled test sieves with increasing aperture size from bottom to top and a sieve pan. |
Standard | HAVER & BOECKER is certified to ISO 9001 and is a leading member of the International Standards Committee for Test Sieves (ISO TC 24). HAVER Test Sieves are fabricated according to the valid standards: ISO 565, ISO 3310, ASTM E11, BS 410, NEN 2560, ISO 5223... The "International Test Sieve Comparison Table" gives a general idea. |
T
U
V
W
Warp | All wires running lengthwise of the cloth as woven. |
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Weft | All wires running across the cloth as woven. |
Wet sieving | Sieving with fluids. |
Wire diameter | Diameter of the wire in the woven cloth. |
Woven wire cloth | Produced by HAVER & BOECKER Wire Weaving Division, made from wire with square aperture sizes from 20 micron up to 125 mm. |
X
X-Tolerance | Tolerance for the single values of all measured aperture sizes (w), specified in standards. No aperture size that is measured in warp and weft direction shall exceed X. |
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Y
Y Tolerance | Tolerance for the arithmetic mean value of the sum of all measured aperture sizes (w), measured separately in warp and weft direction. It is specified in standards. |
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