Dynamic Image Analysis (DIA)
HAVER & BOECKER is internationally know as manufacturer of systems, machines and sieve media for generations. This experience and a wide know-how of our engineering specialists provided the ideal conditions for development of a new technology in the early 90s: the Computerized Particle Analysis for particle size and particle shape analysis of dry and non-agglomerating bulk material.
Today HAVER CPA systems provide particle analyses with standardised units and customised inline and online solutions for the largest abstract measuring range from 10 micron up to 400 mm. All particles of a sample which lie within the measuring range are analysed and counted in real time due to the approved line scan camera.