|Aperture size||Distance between two adjacent warp and weft wires, measured in the projected plane at the mid-positions (w).|
|ASTM E11||= American Society for Testing and Materials; HAVER Test Sieves are also fabricated according to this standard (see International Test Sieve Comparison Table).|
|Analysis instrument||HAVER CPA systems provide particle analyses with standardised units and customised inline and online solutions for the largest abstract measuring range from 10 micron up to 400 mm.|
|BS 410||= British Standards; HAVER Test Sieves are also fabricated according to this standard (see International Test Sieve Comparison Table).|
|Calibration||See "Certification". For calibration thrice as many meshes are measured as for certification.|
Inspection of test sieves; the sieve medium is measured in warp and weft direction with a calibrated measuring system at the customer's premises or in the laboratory of HAVER & BOECKER. The result is an inspection certificate 3.1 according to DIN EN 10 204.
Test sample placed on a test sieve.
|Coning and Quartering|
Common manual method of sample preparation:
1. Pile the sample in a cone.
2. Spread the pile our in a circle with a uniform thickness.
3. Divide the circle into equal quarters.
4. Discard two opposite quarters and shovel them into a conival pile for a second division.
(„Test Sieving Handbook No. 53, 2003 Edition“ by W.S.TYLER)
= Computerized Particle Analysis: Technology of HAVER & BOECKER for photo-optical particle size and shape analysis of bulk materials.
|DIN ISO||HAVER Test Sieves are also fabricated according to this standard; DIN ISO 3310-1: sieve medium = woven wire clothDIN ISO 3310-2: sieve medium = perforated plate(see International Test Sieve Comparison Table)|
|Dry sieving:||Sieving of bulk material without using of water.|
|Dynamic image analysis:||Particle size and particle shape with dynamic image analysis|
|Electroformed sheet:||Electrochemically produced nickel foils have round or square holes in the micron range from 5 µm to 100 µm.|
|Excentric division:||The particles are accelerated outwards by means of a rotating cone in the rotating samle reducer and fall into the guide channels randomly.|
|Feret diameter (minimum):||Smallest photo-optically detected particle dimension between two parallel tangents of the particle contour. When compared to sieve analysis results, it is a good approximation of the aperture size that the particle just passes through.|
|Feret diameter (maximum):||Largest photo-optically detected particle dimension. It is found by considering all possible connections between the pixel points of the projection surface and is not dependent on angle.|
|Gold Test Sieves||HAVER Test Sieves / Quality "Gold" with tolerances 50% smaller than the tolerances as specified by ISO 3310-1.|
|HAVER REAL TIME:||During the photo-optical particle analysis (HAVER CPA) the shadow projections of the particles are evaluated simultaneously to the measuring process in real time.|
|Image analysis||see "Dynamic image analysis"|
|International Test Sieve Comparison Table||Listing of all standards for the fabrication of test sieves with the corresponding aperture sizes / openings.|
|Light source||LED light module in the HAVER CPA; the shadows of the free-falling particles are formed in the background of this light.|
|Line scan camera||Digital camera with one pixel line. The operating mode is comparable with a scanner.|
|Nominal size||Aperture size (woven wire cloth), size of hole (perforated plate)|
|Particle list||Option in the Software HAVER CpaServ EXPERT. The table lists each single particle along with a scaled figure and diverse measurement and analysis values. Using the function of the particle list, a supplemental manual evaluation can follow. Also filter values or user-defined classifications of the shape class, for example, can be established as well.|
|Particle size analysis|
With HAVER CPA different size parameters are analysed: Feret diameter, Equivalent diameter, Length, Width (maximum), Martin diameter, Chord (maximum)
Sieve analysis: smallest aperture size in a sieve medium the particle passes through.
|Particle size distribution||Result of particle analysis: frequency distribution of particle sizes, displayed in bar or line diagram (distribution curve).|
|Perforated plate||Sieve medium; plate made from galvanized steel or stainless steel with regularly arranged round or square holes.|
|Photo-optical particle analysis||Computerized analysis of bulk materials concerning particle size and particle shape (dynamic image analysis, CPA).|
|Sample||Representative part from a quantity of material or a product stream.|
|Sieve analysis||Separation and analysis of particle sizes of a sample of bulk material by means of one test sieve or a test sieve shaker and several test sieves.|
|Sieve medium||Woven wire cloth or perforated plates in test sieves with identical, regularly arranged apertures.|
|Sieve pan||Collecting pan for the finest material of a sample at the bottom head of a sieve tower; available in all sieve diameters.|
|Sieve set||Tower made from two or more assembled test sieves with increasing aperture size from bottom to top and a sieve pan.|
|Standard||HAVER & BOECKER is certified to ISO 9001 and is a leading member of the International Standards Committee for Test Sieves (ISO TC 24). HAVER Test Sieves are fabricated according to the valid standards: ISO 565, ISO 3310, ASTM E11, BS 410, NEN 2560, ISO 5223... The "International Test Sieve Comparison Table" gives a general idea.|
|Warp||All wires running lengthwise of the cloth as woven.|
|Weft||All wires running across the cloth as woven.|
|Wet sieving||Sieving with fluids.|
|Wire diameter||Diameter of the wire in the woven cloth.|
|Woven wire cloth||Produced by HAVER & BOECKER Wire Weaving Division, made from wire with square aperture sizes from 20 micron up to 125 mm.|
|X-Tolerance||Tolerance for the single values of all measured aperture sizes (w), specified in standards. No aperture size that is measured in warp and weft direction shall exceed X.|
|Y Tolerance||Tolerance for the arithmetic mean value of the sum of all measured aperture sizes (w), measured separately in warp and weft direction. It is specified in standards.|